文章名称: Creep behavior of Ti-6242 : the effect of microstructure and silicon content 文章英文名称: Creep behavior of Ti-6242 : the effect of microstructure and silicon content 关键词: 摘要: 作者: W. CHO, J.W. JONES, J.E. ALLISON and W.T. DONLON 作者单位:
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Creep behavior of Ti-6242 : the effect of microstructure and silicon content